Diffraction based transmission X-ray microscopy
D-TXM is a five year project funded by an ERC grant. The aim of this project is to develop a diffraction based transmission X-ray microscope for non-destructive structural characterization of polycrystalline materials such as metals, ceramics, semiconductors, dust, soil and rocks, and for R&D applications in e.g. the energy-, electronics- and environmental sectors. Uniquely, d-TXM will be able to visualize the grains inside 100 micrometer thick specimens with a spatial resolution of 10-30 nm.